Test Technology
Symposium 2025
February 12-13, 2025 | Zwolle, The Netherlands
Thank you!
On behalf of Salland Engineering, we sincerely thank you for attending our Test Technology Symposium last week. Your presence, engagement, and contributions made the event a great success!
We hope you found the discussions and presentations insightful and valuable; your participation helped develop meaningful conversations, and we truly appreciate your time and support.
Event Photos
Made by Rick Kloekke Fotografie
HIGH-LEVEL SYMPOSIUM PROGRAM
The symposium will start on Wednesday, February 12 at the Lumen Event Center in Zwolle (right next to Hotel Lumen), The Netherlands, at 09:00 with registration and coffee/tea. After the opening session, the Test Technology Symposium will have several paper sessions during the day, a tour through our upgraded facility and a social evening event. On Thursday, February 13, the symposium will continue, followed by a closing network event with drinks and snacks around 16:00. Please follow the registration link above to secure your tickets and follow our guideline below to book your hotel room incl. breakfast & free parking at a special rate.
Vendor Fair
On both days of the symposium, there will be a Vendor Fair in the event center, close to the presentation area; demo tables/booths will be available to showcase products and/or services. During the various breaks there will be an opportunity to visit the Vendor Fair.
Wednesday, February 12 (Day 1)
| 09:00 | REGISTRATION AND COFFEE/TEA |
| 09:30 | Keynote: Opening & Sallands vision on the future of test Paul van Ulsen - Salland Engineering |
| 10:00 | Defining industrial quantum chip testing Adriaan Rol - Orange Quantum Systems |
| 10:30 | Breaking the Defect Barrier: The Evolution and Future of VLSI Testing with Device-Aware Methods Said Hamdioui - TU Delft |
| 11:00 | SHORT BREAK WITH VENDOR FAIR |
| 11:15 | AI processor test and characterization requirements Mark Dellow - Axelera AI |
| 11:45 | Challenges and Opportunities in Testing of Integrated Photonics Sylwester Latkowsky - University Eindhoven |
| 12:15 | To-test, or not-to-test: balancing between costs of testing and quality Ercan Sengil - Philips Micro Devices |
| 12:45 | LUNCH WITH VENDOR FAIR |
| 13:30 | ESA TRUTHS Radiometer Electronics: Testing Methodologies for Electronics Development and Characterization Manfred Gyo - PMOD World Radiation Centre |
| 14:00 | Photonics Following Semiconductor Manufacturing’s Path Scott Jordan - Physik Instrumente |
| 14:30 | SHORT BREAK WITH VENDOR FAIR |
| 15:00 | Benefits of combined Electrical and Optical Test on small devices & the added value of Artificial Intelligence on Optical Inspection Raul Arriola - Cohu |
| 15:30 | A Tester on a Probe Card Patrick Sullivan - ElevATE Semiconductors |
| 16:15 | SALLAND COMPANY TOUR |
| 19:00 | DINNER & SOCIAL NETWORK EVENT |
Thursday, February 13 (Day 2)
| 08:30 | REGISTRATION AND COFFEE/TEA |
| 09:00 | Wafer Acceptance Testing: Leveraging Low Leakage Switching with Switched Guard Technology Noman Hussain - Pickering |
| 09:30 | Evolution of PXI(e) Test for Digital Solutions Matthew Getz - ElevATE Semiconductors |
| 10:00 | Enabling the Industrialization of Quantum Technologies Yoram Vos - TNO |
| 10:30 | A modular Equipment platform for Photonics Metrology Ton Pothoven & Armando Bonilla Fernandez - IMS & Salland Engineering |
| 11:00 | SHORT BREAK WITH VENDOR FAIR |
| 11:15 | Increase DAQ System Density and Throughput with Multi-channel Flexible-Input Simultaneous-Sampling ADCs Lluis Beltran Gil - Analog Devices |
| 11:45 | Analog test signal generation for embedded ADCs in Radar ICs Armin Schilke - Infineon Technologies |
| 12:15 | Design Automation Trends in the Age of AI Bill Wymbs - AllianceATE |
| 12:45 | LUNCH WITH VENDOR FAIR |
| 13:30 | GROUP PHOTO |
| 14:00 | Test & Coverage for Spiking Compute SoC at the Sensor Edge Aditya Dalakoti - Innatera |
| 14:30 | Emerging PMIC Trends Demand Test Innovations Thomas Koehler - Teradyne |
| 15:00 | Paradigm shift of the test for AI chips Eugene Lin - Chroma ATE |
| 15:30 | Generative AI Test Challenges & V93000 Solution Michael Braun - Advantest |
| 16:15 | Increasing the quality of your in-system test Lee Harrison - Siemens |
| 16:45 | CLOSING DRINKS |
| 17:30 | END SYMPOSIUM |