Test Technology
Symposium 2025

February 12-13, 2025 | Zwolle, The Netherlands

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We are thrilled to announce the 5th edition of our Test Technology Symposium on Wednesday February 12 and Thursday February 13 at Event Center Lumen in Zwolle, the Netherlands.

 

Together with top ATE companies, our customers, leading universities, and industry institutes, we will explore the cutting-edge advancements in semiconductor-, photonics-, and quantum test technologies. We will showcase the latest innovations and discuss how these technologies contribute to

The Evolution of Test

in the continuously evolving landscape of high-tech industries and global supply chains. We like to invite you to participate in our 2-day event, discuss the challenges ahead on a wide range of topics and visit our facility in Zwolle. This collaborative event will provide a unique opportunity to follow workshops, exchange knowledge, foster partnerships, and drive forward the next generation of test solutions for tomorrow’s most advanced technologies.

Registration closed!
Unfortunately, registration for the Symposium is closed. Please contact us at events@salland.com for ticket availability and/or in case of questions.

ANALOG/DIGITAL/PHOTONICS SEMINAR

On Tuesday afternoon, February 11, the day before our official Test Technology Symposium, we offer a special seminar to follow three parallel tracks with tutorials/demonstrations in which we will highlight our Automated Test Solutions for pre and post silicon to test Analog, Digital and Photonics/MEMS devices. The seminar will provide a high-level overview of the day-to-day test and characterization challenges that can be addressed with our highly efficient, automated Test-lab-in a Box solutions. All these solutions have in common that you only need one fully automated box to help you with this. Whether you are an engineer, manager or senior Executive, the seminar will provide valuable insights in optimizing your test environment and processes.

There will be three parallel tracks (Analog, Digital, Photonics) in the first block and after a short break, the same three tracks will be repeated in a second block. Don't miss the opportunity and register for this seminar as well so we can send you more information by email.

HIGH-LEVEL SYMPOSIUM PROGRAM

The symposium will start on Wednesday, February 12 at the Lumen Event Center in Zwolle (right next to Hotel Lumen), The Netherlands, at 09:00 with registration and coffee/tea. After the opening session, the Test Technology Symposium will have several paper sessions during the day, a tour through our upgraded facility and a social evening event. On Thursday, February 13, the symposium will continue, followed by a closing network event with drinks and snacks around 16:00. Please follow the registration link above to secure your tickets and follow our guideline below to book your hotel room incl. breakfast & free parking at a special rate.

Vendor Fair

On both days of the symposium, there will be a Vendor Fair in the event center, close to the presentation area; demo tables/booths will be available to showcase products and/or services. During the various breaks there will be an opportunity to visit the Vendor Fair.

Wednesday, February 12 (Day 1)

09:00 REGISTRATION AND COFFEE/TEA
09:30 Keynote: Opening & Sallands vision on the future of test
Paul van Ulsen - Salland Engineering
10:00 Defining industrial quantum chip testing
Adriaan Rol - Orange Quantum Systems
10:30 Breaking the Defect Barrier: The Evolution and Future of VLSI Testing with Device-Aware Methods
Said Hamdioui - TU Delft
11:00 SHORT BREAK WITH VENDOR FAIR
11:15 AI processor test and characterization requirements
Mark Dellow - Axelera AI
11:45 Challenges and Opportunities in Testing of Integrated Photonics
Sylwester Latkowsky - University Eindhoven
12:15 To-test, or not-to-test: balancing between costs of testing and quality
Ercan Sengil - Philips Micro Devices
12:45 LUNCH WITH VENDOR FAIR
13:30 ESA TRUTHS Radiometer Electronics: Testing Methodologies for Electronics Development and Characterization
Manfred Gyo - PMOD World Radiation Centre
14:00 Photonics Following Semiconductor Manufacturing’s Path
Scott Jordan - Physik Instrumente
14:30 SHORT BREAK WITH VENDOR FAIR
15:00 Benefits of combined Electrical and Optical Test on small devices & the added value of Artificial Intelligence on Optical Inspection
Raul Arriola - Cohu
15:30 A Tester on a Probe Card
Patrick Sullivan - ElevATE Semiconductors
16:15 SALLAND COMPANY TOUR
19:00 DINNER & SOCIAL NETWORK EVENT

Thursday, February 13 (Day 2)

08:30 REGISTRATION AND COFFEE/TEA
09:00 Wafer Acceptance Testing: Leveraging Low Leakage Switching with Switched Guard Technology
Noman Hussain - Pickering
09:30 Evolution of PXI(e) Test for Digital Solutions
Matthew Getz - ElevATE Semiconductors
10:00 Enabling the Industrialization of Quantum Technologies
Yoram Vos - TNO
10:30 A modular Equipment platform for Photonics Metrology
Ton Pothoven & Armando Bonilla Fernandez - IMS & Salland Engineering
11:00 SHORT BREAK WITH VENDOR FAIR
11:15 Increase DAQ System Density and Throughput with Multi-channel Flexible-Input Simultaneous-Sampling ADCs
Lluis Beltran Gil - Analog Devices
11:45 Analog test signal generation for embedded ADCs in Radar ICs
Armin Schilke - Infineon Technologies
12:15 Design Automation Trends in the Age of AI
Bill Wymbs - AllianceATE
12:45 LUNCH WITH VENDOR FAIR
13:30 GROUP PHOTO
14:00 Test & Coverage for Spiking Compute SoC at the Sensor Edge
Aditya Dalakoti - Innatera
14:30 Emerging PMIC Trends Demand Test Innovations
Thomas Koehler - Teradyne
15:00 Paradigm shift of the test for AI chips
Eugene Lin - Chroma ATE
15:30 Generative AI Test Challenges & V93000 Solution
Michael Braun - Advantest
16:15 Increasing the quality of your in-system test
Lee Harrison - Siemens
16:45 CLOSING DRINKS
17:30 END SYMPOSIUM