Test Technology
Symposium 2025

February 12-13, 2025 | Zwolle, The Netherlands

Thank you!

On behalf of Salland Engineering, we sincerely thank you for attending our Test Technology Symposium last week. Your presence, engagement, and contributions made the event a great success!

We hope you found the discussions and presentations insightful and valuable; your participation helped develop meaningful conversations, and we truly appreciate your time and support.

Event Photos

Made by Rick Kloekke Fotografie

HIGH-LEVEL SYMPOSIUM PROGRAM

The symposium will start on Wednesday, February 12 at the Lumen Event Center in Zwolle (right next to Hotel Lumen), The Netherlands, at 09:00 with registration and coffee/tea. After the opening session, the Test Technology Symposium will have several paper sessions during the day, a tour through our upgraded facility and a social evening event. On Thursday, February 13, the symposium will continue, followed by a closing network event with drinks and snacks around 16:00. Please follow the registration link above to secure your tickets and follow our guideline below to book your hotel room incl. breakfast & free parking at a special rate.

Vendor Fair

On both days of the symposium, there will be a Vendor Fair in the event center, close to the presentation area; demo tables/booths will be available to showcase products and/or services. During the various breaks there will be an opportunity to visit the Vendor Fair.

Wednesday, February 12 (Day 1)

09:00 REGISTRATION AND COFFEE/TEA
09:30 Keynote: Opening & Sallands vision on the future of test
Paul van Ulsen - Salland Engineering
10:00 Defining industrial quantum chip testing
Adriaan Rol - Orange Quantum Systems
10:30 Breaking the Defect Barrier: The Evolution and Future of VLSI Testing with Device-Aware Methods
Said Hamdioui - TU Delft
11:00 SHORT BREAK WITH VENDOR FAIR
11:15 AI processor test and characterization requirements
Mark Dellow - Axelera AI
11:45 Challenges and Opportunities in Testing of Integrated Photonics
Sylwester Latkowsky - University Eindhoven
12:15 To-test, or not-to-test: balancing between costs of testing and quality
Ercan Sengil - Philips Micro Devices
12:45 LUNCH WITH VENDOR FAIR
13:30 ESA TRUTHS Radiometer Electronics: Testing Methodologies for Electronics Development and Characterization
Manfred Gyo - PMOD World Radiation Centre
14:00 Photonics Following Semiconductor Manufacturing’s Path
Scott Jordan - Physik Instrumente
14:30 SHORT BREAK WITH VENDOR FAIR
15:00 Benefits of combined Electrical and Optical Test on small devices & the added value of Artificial Intelligence on Optical Inspection
Raul Arriola - Cohu
15:30 A Tester on a Probe Card
Patrick Sullivan - ElevATE Semiconductors
16:15 SALLAND COMPANY TOUR
19:00 DINNER & SOCIAL NETWORK EVENT

Thursday, February 13 (Day 2)

08:30 REGISTRATION AND COFFEE/TEA
09:00 Wafer Acceptance Testing: Leveraging Low Leakage Switching with Switched Guard Technology
Noman Hussain - Pickering
09:30 Evolution of PXI(e) Test for Digital Solutions
Matthew Getz - ElevATE Semiconductors
10:00 Enabling the Industrialization of Quantum Technologies
Yoram Vos - TNO
10:30 A modular Equipment platform for Photonics Metrology
Ton Pothoven & Armando Bonilla Fernandez - IMS & Salland Engineering
11:00 SHORT BREAK WITH VENDOR FAIR
11:15 Increase DAQ System Density and Throughput with Multi-channel Flexible-Input Simultaneous-Sampling ADCs
Lluis Beltran Gil - Analog Devices
11:45 Analog test signal generation for embedded ADCs in Radar ICs
Armin Schilke - Infineon Technologies
12:15 Design Automation Trends in the Age of AI
Bill Wymbs - AllianceATE
12:45 LUNCH WITH VENDOR FAIR
13:30 GROUP PHOTO
14:00 Test & Coverage for Spiking Compute SoC at the Sensor Edge
Aditya Dalakoti - Innatera
14:30 Emerging PMIC Trends Demand Test Innovations
Thomas Koehler - Teradyne
15:00 Paradigm shift of the test for AI chips
Eugene Lin - Chroma ATE
15:30 Generative AI Test Challenges & V93000 Solution
Michael Braun - Advantest
16:15 Increasing the quality of your in-system test
Lee Harrison - Siemens
16:45 CLOSING DRINKS
17:30 END SYMPOSIUM