Test Technology
Symposium 2025
February 12-13, 2025 | Zwolle, The Netherlands
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We are thrilled to announce the 5th edition of our Test Technology Symposium on Wednesday February 12 and Thursday February 13 at Event Center Lumen in Zwolle, the Netherlands.
Together with top ATE companies, our customers, leading universities, and industry institutes, we will explore the cutting-edge advancements in semiconductor-, photonics-, and quantum test technologies. We will showcase the latest innovations and discuss how these technologies contribute to
The Evolution of Test
in the continuously evolving landscape of high-tech industries and global supply chains. We like to invite you to participate in our 2-day event, discuss the challenges ahead on a wide range of topics and visit our facility in Zwolle. This collaborative event will provide a unique opportunity to follow workshops, exchange knowledge, foster partnerships, and drive forward the next generation of test solutions for tomorrow’s most advanced technologies.
Registration closed!
ANALOG/DIGITAL/PHOTONICS SEMINAR
On Tuesday afternoon, February 11, the day before our official Test Technology Symposium, we offer a special seminar to follow three parallel tracks with tutorials/demonstrations in which we will highlight our Automated Test Solutions for pre and post silicon to test Analog, Digital and Photonics/MEMS devices. The seminar will provide a high-level overview of the day-to-day test and characterization challenges that can be addressed with our highly efficient, automated Test-lab-in a Box solutions. All these solutions have in common that you only need one fully automated box to help you with this. Whether you are an engineer, manager or senior Executive, the seminar will provide valuable insights in optimizing your test environment and processes.
There will be three parallel tracks (Analog, Digital, Photonics) in the first block and after a short break, the same three tracks will be repeated in a second block. Don't miss the opportunity and register for this seminar as well so we can send you more information by email.
ANALOG TRACK
Analog converters characterization using the ATX7006A
Characterizing analog converters is challenging due to the high signal accuracy required. Reliable results demand precise tools with minimal system noise. The ATX7006A offers both accuracy and versatility, simplifying complex analog testing while ensuring precise measurements like SNR, THD, BW, INL, and DNL.
In this track, we’ll demonstrate how the ATX7006A streamlines testing, enhancing efficiency and accelerating development. Its precision makes it ideal for high-quality results and faster time-to-market.
To see how this system can elevate your analog testing workflow, we encourage you to join this track.
Presented by:
Horst Beekhuizen - Salland Engineering
Iwan Boersma - Applicos
DIGITAL TRACK
Advanced Digital Testing by a Desktop Digital Tester & Tooling
Digital technology is everywhere, and modern silicon designs require testing thousands of patterns, making automation and parallel processing essential. EDA-generated digital patterns must be converted, validated, and refined for effective testing.
In this track, Salland will showcase its next-generation digital test system—an easy-to-use, cost-effective solution for streamlining digital and DC testing from EDA tooling to high-speed silicon validation. Powered by the DTX system with SE-DPin and SMU16 PXIe cards, it delivers ATE-quality performance in a PXI format.
To see how a desktop solution can enhance your Digital Post Silicon Validation, we encourage you to join this track.
Presented by:
Veets Veitas - Salland Engineering
Bill Wymbs - Alliance ATE
PHOTONICS TRACK
How to test PIC’s using new methods and with Automated systems
More-than-Moore circuits demand new testing methods, as traditional electrical testing is insufficient. While SiPh-based products dominate over 90% of the PIC market, much of the Dutch and European photonics ecosystem relies on emerging technologies like SiN and InP. The MEKOPP consortium is driving metrology advancements to improve process control and yield for larger wafer sizes.
This track will explore test challenges, automation, and high-volume characterization of PICs and MEMS. We’ll showcase IMS systems with AI-driven analytics, the Helios Optical Inspection System (remote demo), and Salland’s PTX-powered Sirius PIC test system, including a live PTX demonstration.
To explore the future of photonics testing, we encourage you to join this track.
Presented by:
Ton Pothoven - IMS
Armando - Salland Engineering
Rik Wetzels - Nobleo
13:30 | Walk-in Salland Engineering |
14:00 | Welcome and seminar introduction |
14:15 | ANALOG TRACK |
15:45 | Short Break |
16:00 | ANALOG TRACK |
17:30 | Closing Drinks |
13:30 | Walk-in Salland Engineering |
14:00 | Welcome and seminar introduction |
14:15 | DIGITAL TRACK |
15:45 | Short Break |
16:00 | DIGITAL TRACK |
17:30 | Closing Drinks |
13:30 | Walk-in Salland Engineering |
14:00 | Welcome and seminar introduction |
14:15 | PHOTONICS TRACK |
15:45 | Short Break |
16:00 | PHOTONICS TRACK |
17:30 | Closing Drinks |
HIGH-LEVEL SYMPOSIUM PROGRAM
The symposium will start on Wednesday, February 12 at the Lumen Event Center in Zwolle (right next to Hotel Lumen), The Netherlands, at 09:00 with registration and coffee/tea. After the opening session, the Test Technology Symposium will have several paper sessions during the day, a tour through our upgraded facility and a social evening event. On Thursday, February 13, the symposium will continue, followed by a closing network event with drinks and snacks around 16:00. Please follow the registration link above to secure your tickets and follow our guideline below to book your hotel room incl. breakfast & free parking at a special rate.
Vendor Fair
On both days of the symposium, there will be a Vendor Fair in the event center, close to the presentation area; demo tables/booths will be available to showcase products and/or services. During the various breaks there will be an opportunity to visit the Vendor Fair.
Wednesday, February 12 (Day 1)
09:00 | REGISTRATION AND COFFEE/TEA |
09:30 | Keynote: Opening & Sallands vision on the future of test Paul van Ulsen - Salland Engineering |
10:00 | Defining industrial quantum chip testing Adriaan Rol - Orange Quantum Systems |
10:30 | Breaking the Defect Barrier: The Evolution and Future of VLSI Testing with Device-Aware Methods Said Hamdioui - TU Delft |
11:00 | SHORT BREAK WITH VENDOR FAIR |
11:15 | AI processor test and characterization requirements Mark Dellow - Axelera AI |
11:45 | Challenges and Opportunities in Testing of Integrated Photonics Sylwester Latkowsky - University Eindhoven |
12:15 | To-test, or not-to-test: balancing between costs of testing and quality Ercan Sengil - Philips Micro Devices |
12:45 | LUNCH WITH VENDOR FAIR |
13:30 | ESA TRUTHS Radiometer Electronics: Testing Methodologies for Electronics Development and Characterization Manfred Gyo - PMOD World Radiation Centre |
14:00 | Photonics Following Semiconductor Manufacturing’s Path Scott Jordan - Physik Instrumente |
14:30 | SHORT BREAK WITH VENDOR FAIR |
15:00 | Benefits of combined Electrical and Optical Test on small devices & the added value of Artificial Intelligence on Optical Inspection Raul Arriola - Cohu |
15:30 | A Tester on a Probe Card Patrick Sullivan - ElevATE Semiconductors |
16:15 | SALLAND COMPANY TOUR |
19:00 | DINNER & SOCIAL NETWORK EVENT |
Thursday, February 13 (Day 2)
08:30 | REGISTRATION AND COFFEE/TEA |
09:00 | Wafer Acceptance Testing: Leveraging Low Leakage Switching with Switched Guard Technology Noman Hussain - Pickering |
09:30 | Evolution of PXI(e) Test for Digital Solutions Matthew Getz - ElevATE Semiconductors |
10:00 | Enabling the Industrialization of Quantum Technologies Yoram Vos - TNO |
10:30 | A modular Equipment platform for Photonics Metrology Ton Pothoven & Armando Bonilla Fernandez - IMS & Salland Engineering |
11:00 | SHORT BREAK WITH VENDOR FAIR |
11:15 | Increase DAQ System Density and Throughput with Multi-channel Flexible-Input Simultaneous-Sampling ADCs Lluis Beltran Gil - Analog Devices |
11:45 | Analog test signal generation for embedded ADCs in Radar ICs Armin Schilke - Infineon Technologies |
12:15 | Design Automation Trends in the Age of AI Bill Wymbs - AllianceATE |
12:45 | LUNCH WITH VENDOR FAIR |
13:30 | GROUP PHOTO |
14:00 | Test & Coverage for Spiking Compute SoC at the Sensor Edge Aditya Dalakoti - Innatera |
14:30 | Emerging PMIC Trends Demand Test Innovations Thomas Koehler - Teradyne |
15:00 | Paradigm shift of the test for AI chips Eugene Lin - Chroma ATE |
15:30 | Generative AI Test Challenges & V93000 Solution Michael Braun - Advantest |
16:15 | Increasing the quality of your in-system test Lee Harrison - Siemens |
16:45 | CLOSING DRINKS |
17:30 | END SYMPOSIUM |