Test Technology Symposium 2023
September 27-28, 2023 | Zwolle, The Netherlands
Thank you for being part of the Salland Test Technology Symposium 2023!
The Symposium is behind us and we are grateful for your participation and for sharing your valuable knowledge. A massive "Thank You" for the high level of technical presentations and the many engaging conversations to make this event - again - a great success. We sincerely hope you enjoyed the Symposium and we look forward seeing you at the next edition.
Like to relive this event?
Please check your inbox. We provided all participants a link where you can download the presentations of the symposium in PDF which are released for publication*.
PRESENTERS
HIGH-LEVEL PROGRAM
The symposium will start on Wednesday, September 27 at the Lumen Event Center in Zwolle (right next to Hotel Lumen), The Netherlands, at 09:00 with registration and coffee/tea. After the opening session, the Test Technology Symposium will have several paper sessions during the day, a tour through our upgraded facility and a social evening event. On Thursday, September 28, the symposium will continue, followed by a closing network event with drinks and snacks around 16:00. Please follow the registration link above to secure your tickets and follow our guideline below to book your hotel room incl. breakfast & free parking at a special rate.
Wednesday, September 27, 2023 (Day 1)
| 09:00 | REGISTRATION AND COFFEE/TEA |
| 09:30 | Keynote: Sallands vision on the future of test Paul van Ulsen - Salland Engineering |
| 10:00 | Tessent™ Streaming Scan Networks (SSN): An Introduction for Test & Product Engineers Christian Dodd - Siemens |
| 10:30 | Challenges and Developments in Reliability Testing Wouter ter Laak - Eurofins | MASER |
| 11:00 | SHORT BREAK WITH VENDOR FAIR |
| 11:15 | Testing a 2x25W class D output stage Lûtsen Dooper - Axign |
| 11:45 | New Methods & Tools in MEMS/Photonic Testing Aleksandar Andreski & Bart Oude Lohuis - Salland Engineering & IMS |
| 12:15 | Signal-chain noise application and challenges Martin Walker - Analog Devices |
| 12:45 | LUNCH WITH VENDOR FAIR |
| 13:30 | Tackling the quantum device testing bottleneck Adriaan Rol - Orange Quantum Systems |
| 14:00 | Elevating Innovation in ATE Semiconductors Matthew Getz - Elevate Semiconductor |
| 14:30 | SHORT BREAK WITH VENDOR FAIR |
| 15:00 | Visual Basic for Applications (VBA) to C-based test program conversion David Forsythe - Chroma ATE |
| 15:30 | |
| 16:15 | GROUP PHOTO & TOUR AT SALLAND |
| 19:00 | SOCIAL EVENT |
Thursday, September 28, 2023 (Day 2)
| 08:30 | REGISTRATION AND COFFEE/TEA |
| 09:00 | About Brains, Semicons and Presentations Roman Gramse - Gramse IO |
| 09:30 | Dutch Semicon and Quantum Technologies Rogier Verberk - TNO |
| 10:00 | Salland product roadmap and new products Paul van Ulsen & Armando Bonilla Fernandez - Salland Engineering |
| 10:30 | Future trends and challenges in Lithography Marcelo Ackermann - University of Twente |
| 11:00 | SHORT BREAK WITH VENDOR FAIR |
| 11:15 | Phazor RF Probe Solutions for Next Generation RF upto 110Ghz Gordon Cowan - PTSL |
| 11:45 | Relay selection considerations for the future of high-density test solutions Eric Bower & Seena Partokia - Atomica |
| 12:15 | A Testing Perspective on Scaling Integrated Photonics to High Volumes Kees Propstra - Quantifi Photonics |
| 12:45 | LUNCH WITH VENDOR FAIR |
| 13:30 | GROUP PHOTO |
| 14:00 | Solving the challenges of the next generation of SLT tests Herbert Tsai - Chroma ATE |
| 14:30 | Sense+, an innovative concept for handling low to high-end sensors Alex Waldauf - Cohu |
| 15:00 | Efficient support of scan bus architectures and packetized scan test on Advantest V93000 Michael Braun - Advantest |
| 15:30 | From 5G mmWave to 6G THz: High-volume Handler-based OTA Testing of AiP Devices Jeorge Hurtarte - Teradyne |
| 16:00 | CLOSING DRINKS |
| 17:00 | END SYMPOSIUM |